The object of this study is for developing defective fruit inspection system by machine vision. Spectral reflectances of the normal peach surface and defects were measured in the wavelength between 390nm and 2000nm.
The report deals with a trial of developing an image analysis algorithms based on NTSC r, g, b chromaticity in color image and the gray level of infrared image to indentify defects.
The image data was filtered to removed interferance due to pixel to pixel variation in the camera and back ground noise, and then, the defect parts were separated from the rest by a threshold.
As the result, it was admitted that the defects such as compression, cut, insect pest, bruise and etc. could be separated from normal peach surface by chromatic cluster of the color image or gray level of the infrared image.