Atomic Scale Insights into Si Transport Pathway in Si-oxide Film Based on Theoretical Investigation of Medium Density Effects

e-Journal of Surface Science and Nanotechnology Volume 23 Issue 3 Page 306-313 published_at 2025-07-17
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Title ( jpn )
Atomic Scale Insights into Si Transport Pathway in Si-oxide Film Based on Theoretical Investigation of Medium Density Effects
Creator
Akiyama Toru Graduate School of Engineering, Mie University
Shiraishi Kenji Institute of Materials and Systems for Sustainability, Nagoya University / Graduate School of Engineering, Nagoya University
Source Title
e-Journal of Surface Science and Nanotechnology
Volume 23
Issue 3
Start Page 306
End Page 313
Journal Identifire
PISSN 1348-0391
Language
eng
Resource Type journal article
Publisher
The Japan Society of Vacuum and Surface Science
Date of Issued 2025-07-17
権利関係(リンク) Atomic Scale Insights into Si Transport Pathway in Si-oxide Film Based on Theoretical Investigation of Medium Density Effects © 2025 by Kageshima Hiroyuki / Akiyama Toru / Shiraishi Kenji is licensed under CC BY 4.0
Publish Type Version of Record
Access Rights open access
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