| File | |
| Title |
Hot-Carrier-Degradation of Hetero-Interface in SiGe/Si-Hetero-MOSFETs
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| Creator | |
| Descriptions |
■発表会名:2nd International Workshop on New Group IV Semiconductor Nanoelectronics■主催者名:電気通信研究所■開催場所:仙台■発表年月:2006年10月2日～2006年10月3日========================================
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| Language |
jpn
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| Resource Type | conference paper |
| Date of Issued | 2006 |
| Publish Type | Accepted Manuscript |
| Access Rights | open access |
