| File | |
| Title |
Characterization of Hot-Carrier Degraded SiGe/Si-Hetero-PMOSFETs
|
| Creator | |
| Source Title |
Thin Solid Films
|
| Volume | 508 |
| Issue | 1-2 |
| Start Page | 326 |
| End Page | 328 |
| Journal Identifire |
ISSN 00406090
|
| Subjects |
Metal oxide semiconductor (MOS) devices
Silicon germanium
Hot carrier effects
Interfaces
|
| Language |
eng
|
| Resource Type | journal article |
| Publisher |
Elsevier
|
| Date of Issued | 2006 |
| Rights |
Copyright c 2005 Elsevier B.V. All rights reserved.
|
| Publish Type | Accepted Manuscript |
| Access Rights | open access |
| Relation |
[DOI] 10.1016/j.tsf.2005.07.320
[NCID] AA00863068
|
