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TECHNOLOGY EVOLUTION FOR SILICON NANO-ELECTRONICS 470

Published Date (desc)
Capture/Emission Processes of Carriers in Heterointerface Traps Observed in the Transient Charge-Pumping Characteristics of SiGe/Si-Hetero-Channel pMOSFETs
Author Tsuchiya Toshiaki/ Yoshida Keiichi/ Sakuraba Masao/ Murota Junichi/
Journal Title TECHNOLOGY EVOLUTION FOR SILICON NANO-ELECTRONICS
Volume 470
Published Date 2011
NII Type Journal Article
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