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language
eng
Author
Rahaman M. M. Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
Imai T. NTT Photonic Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan
Miyazu J. NTT Photonic Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan
Kobayashi J. NTT Photonic Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan
Tsukada S. Faculty of Education, University of Shimane, Matsue, Shimane 690-8504, Japan
Helal M. A. Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
Kojima S. Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
Journal Title
JOURNAL OF APPLIED PHYSICS
Volume
116
Issue
7
ISSN
0021-8979
ISSN(Online)
1089-7550
Published Date
2014-08-21
DOI
Publisher
AMER INST PHYSICS
NII Type
Journal Article
OAI-PMH Set
Faculty of Education
Remark
This study was partly supported by a JSPS KAKENHI Grant. The authors thank Dr. T. H. Kim for his technical support of the Raman and Brillouin scattering measurements.
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