language |
jpn
|
Title Alternative (English) | Hetero-Interface-Trap Generation due to Hot Carriers in SiGe/Si-Hetero-MOSFETs
|
Author |
Tsuchiya, Toshiaki
|
Subject | MOSFET
SiGe
ホットキャリア
ヘテロ界面準位
チャージポンピング法
|
Journal Title |
IEEJ Transactions on Electronics, Information and Systems
|
Volume | 126
|
Issue | 9
|
Start Page | 1101
|
End Page | 1106
|
ISSN | 03854221
|
Published Date | 2006
|
DOI | |
NCID | AN10065950
|
Publisher | 電気学会
|
DCMI | text
|
NII Type |
Journal Article
|
OAI-PMH Set |
Interdisciplinary Graduate School of Science and Engineering
|