| Title |
Capture/Emission Processes of Carriers in Heterointerface Traps Observed in the Transient Charge-Pumping Characteristics of SiGe/Si-Hetero-Channel pMOSFETs
|
| Creator |
Tsuchiya Toshiaki
Yoshida Keiichi
Sakuraba Masao
Murota Junichi
|
| Source Title |
TECHNOLOGY EVOLUTION FOR SILICON NANO-ELECTRONICS
|
| Volume | 470 |
| Start Page | 201 |
| End Page | + |
| Journal Identifire |
ISSN 1013-9826
|
| Subjects |
heterointerface trap; carrier capture process; charge pumping; MOSFET
|
| Language |
eng
|
| Resource Type | journal article |
| Publisher |
TRANS TECH PUBLICATIONS LTD
|
| Date of Issued | 2011 |
| Access Rights | metadata only access |
| Relation |
