| タイトル |
Hierarchical dielectric orders in layered ferroelectrics Bi2SiO5
|
| 著者 |
Kim Younghun
Kim Jungeun
Fujiwara Akihiko
Taniguchi Hiroki
Kim Sungwng
Sugimoto Kunihisa
Kato Kenichi
Itoh Mitsuru
Hosono Hideo
Takata Masaki
|
| 収録物名 |
IUCRJ
|
| 巻 | 1 |
| 開始ページ | 160 |
| 終了ページ | 164 |
| 収録物識別子 |
ISSN 2052-2525
|
| 主題 |
electron charge density; electrostatic potential; visualization of local polarization; hierarchical dielectric ordering
|
| 言語 |
英語
|
| 資源タイプ | 学術雑誌論文 |
| 出版者 |
INT UNION CRYSTALLOGRAPHY
|
| 発行日 | 2014-05 |
| アクセス権 | メタデータのみ |
| 関連情報 |
[DOI] 10.1107/S2052252514008008
[PMID] 25075334
|
| 備考 | The X-ray diffraction data were measured at BL02B2 (proposal Nos. 2010B2034 and 2011B2089) of SPring-8. This work was supported in part by RIKEN International Program Associate (IPA), a Grant-in-Aid for Molecular System Research in RIKEN, MEXT Element Strategy Initiative to Form Core Research Centers, and the Ministry of Education, Culture, Sports, Science and Technology of Japan through a Giant-in-Aid for Young Scientists (B, No. 24760543). |
