Wide-range evaluation of the deposition layer thickness distribution on the first wall by reflection coefficient measurements

NUCLEAR MATERIALS AND ENERGY Volume 12 Page 1219-1223 published_at 2017-08
アクセス数 : 1057
ダウンロード数 : 0

今月のアクセス数 : 46
今月のダウンロード数 : 0
Title
Wide-range evaluation of the deposition layer thickness distribution on the first wall by reflection coefficient measurements
Creator
Motojima G.
Yoshida N.
Masuzaki S.
Sakamoto R.
Tokitani M.
Tanaka H.
Murase T.
Nagata D.
Matsumoto K.
Yajima M.
Sakamoto M.
Yamada H.
Morisaki T.
the LHD Experiment Group
Source Title
NUCLEAR MATERIALS AND ENERGY
Volume 12
Start Page 1219
End Page 1223
Journal Identifire
EISSN 2352-1791
Subjects
Reflection coefficient; Color analyzer; Deposition layer; Wall retention; Helium ( Other)
Language
eng
Resource Type journal article
Publisher
ELSEVIER
Date of Issued 2017-08
Access Rights metadata only access
Relation
[DOI] 10.1016/j.nme.2017.04.018
Remark This work was performed with the support and under the auspices of the Collaboration Research program of the National Institute for Fusion Science (NIFS) (NIFSUMPP003-1) and a Sasakawa Grant for Science Fellows (SGSF) from The Japan Science Society (Grant Number F16-103).