島根大学理学部紀要

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島根大学理学部紀要 16
1982-12-25 発行

マイクロ波抵抗率測定のための空洞摂動法

Cavity Perturbation Techniques for Evaluation of Microwave Resistivities
渡部 眞行
岡 真弘 (旧名:正巳)
ファイル
内容記述(抄録等)
The cavity perturbation technique based on the eddy current loss method is modified so as to enable a rather quick measurement of the temperature dependence of microwave resistivities. A heavily doped p-type Si single crystal is employed as a reference to evaluate the resistivities. Some experimental data are given on polycrystalline MnSe specimens.
NCID
AN00108106