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ID 25953
ファイル
言語
英語
著者
KOBAYASHI, Takuo Department of Material Science, Shimane University
TANIGUCHI, Hiromi Department of Physics, Saitama University
OKAMOTO, Hiroyuki Department of Health Sciences, Kanazawa University
内容記述(抄録等)
Crystalline perfection in organic charge-transfer complex single crystals, κ-(BEDT-TTF)2Cu[N(CN)2]Br, was characterized by means of synchrotron X-ray topography. Single crystals of κ-(BEDT-TTF)2Cu[N(CN)2]Br were grown electrochemically using a relatively large glass cell in order to scale up the synthesis. The quality of the crystals was examined using white and monochromatic X-ray topography. There was no asterism of each spot in the Laue photographs, though the defect image in the spot was not resolved because of low-resolution power of the white beam topography. We also obtained monochromatic X-ray topographs with 1.0 Å X-rays and were able to observe line images of dislocations. Dislocation density of the specimen was approximately 7 x 103 cm-2 on an average in the whole area of crystal. However, dislocation lines were annihilated in the topograph taken after annealing at room temperature for 5 months. Furthermore, new lattice defects were generated in the crystal after similar room temperature annealing for 15 months. The change of defect structure was caused by X-ray irradiation because dislocations in the un-irradiated crystal were observed by the monochromatic X-ray topography even after 2 years annealing at room temperature. Point defects formed by the X-ray irradiation probably interacted with grown-in dislocations and secondary defects were formed in the specimen crystal, though a long time was needed for this reaction at room temperature.
主題
synchrotron radiation
topography
organic compound
掲載誌名
Transactions of the Materials Research Society of Japan
38
4
開始ページ
565
終了ページ
568
ISSN
1382-3469
ISSN(Online)
2188-1650
発行日
2013/12/01
DOI
出版者
一般社団法人 日本MRS
出版者ヨミ
イッパン シャダン ホウジン ニホン MRS
資料タイプ
学術雑誌論文
ファイル形式
PDF
著者版/出版社版
出版社版
部局
総合理工学部