number of downloads : ?
language
jpn
Title Alternative (English)
Hetero-Interface-Trap Generation due to Hot Carriers in SiGe/Si-Hetero-MOSFETs
Author
Tsuchiya, Toshiaki
Subject
MOSFET
SiGe
ホットキャリア
ヘテロ界面準位
チャージポンピング法
Journal Title
IEEJ Transactions on Electronics, Information and Systems
Volume
126
Issue
9
Start Page
1101
End Page
1106
ISSN
03854221
Published Date
2006
DOI
NCID
AN10065950
Publisher
電気学会
DCMI
text
NII Type
Journal Article
OAI-PMH Set
Interdisciplinary Graduate School of Science and Engineering
このエントリーをはてなブックマークに追加