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ID 51372
File
language
eng
Author
Kanai, Takashi Faculty of Science, Kanazawa University
Hirano, Kei-ichi High Energy Accelerator Research Organization
Okamoto, Hiroyuki Faculty of Medicine, Kanazawa University
Description
The X-ray refraction imaging technique, diffraction-enhanced X-ray imaging (DEI) method with an asymmetric reflection analyzer was applied to determine the distribution profile of hydride in titanium. Horizontal magnification of the image by the asymmetric reflection was 9 times. Hydride was formed on titanium surface by electrolytic-charging at room temperature for 10, 25.5, 48 and 150 h. The specimen was cut into a 1-mm thick slice for cross-sectional observation. Hydride layer was observed by DEI method as a thick black or white line parallel to the surface. X-ray intensity profile of hydride was measured from the DEI image and converted to the deviation angle of X-ray by refraction using the observed rocking curve. The distribution of refraction index was calculated from the deviation angle of X-ray using Snell’s low. Finally distribution of ratio of hydride and titanium, the concentration profile of hydride, was obtained from that of the refraction index. The distribution profile of hydride in titanium was determined to accuracy of the order of micrometer by means of the DEI method with asymmetric reflection analyzer.
Subject
hydrogen
titanium-hydride
diffraction-enhanced X-ray imaging
Journal Title
Transactions of the Materials Research Society of Japan
Volume
34
Issue
2
Start Page
229
End Page
232
ISSN
1382-3469
ISSN(Online)
2188-1650
Published Date
2009
DOI
Publisher
一般社団法人 日本MRS
Publisher Transcription
イッパン シャダン ホウジン ニホン MRS
NII Type
Journal Article
Format
PDF
Text Version
出版社版
Gyoseki ID
e9273
OAI-PMH Set
Faculty of Science and Engineering