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ID 53679
language
eng
Author
Nishimoto Naoki Shimane Institute for Industrial Technology
Yoshino Katsumi Shimane Institute for Industrial Technology
Fujihara Junko Department of Legal Medicine, Faculty of Medicine, Shimane University
Kitahara Kuninori Interdisciplinary Faculty of Science and Engineering, Shimane University
Subject
Atomic force microscopy; Zinc oxide; Polycrystalline surfaces; Semiconductor-semiconductor thin film structures
Journal Title
E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY
Volume
13
Start Page
185
End Page
189
ISSN
1348-0391
Published Date
2015
DOI
Publisher
SURFACE SCI SOC JAPAN
NII Type
Journal Article
OAI-PMH Set
Faculty of Medicine
Faculty of Science and Engineering