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ID 51370
File
language
eng
Author
Morikawa, Kimihiko Department of Physics and Materials Science, Shimane University
Suzuki, Kazuya Department of Physics and Materials Science, Shimane University
Fujimori, Akane Department of Radiological Technology, Tsukuba International University
Takano, Shuntarou Department of Physics, Kanazawa University
Nakano, Satoshi Ultra-High Pressure Group, National Institute for Materials Science
Okamoto, Hiroyuki School of Health Sciences, Kanazawa University
Description
Three-dimensional (3D) X-ray topography was used to characterize diamond anvil crystals before and after application of ultra-high pressure at 50, 70 and 99.4 GPa. The diffraction planes examined and the wavelength of the monochromatic X-rays were (004), (333), {224}, {440} and 0.0521 nm, respectively. Images of lattice defects in the diamond crystals were reconstructed by stacking approximately 500 X-ray limited projection topographs using the image processing software Image J. The 3D structures and nature of the lattice defects were identified from the reconstructed topographs. A pyramidal shape of four parts of stacking faults was identified using the visibility or invisibility of defect images with each diffraction plane. No significant changes of the lattice defects in the diamond crystals were observed under pressurization at 70 GPa. However, one of the anvil crystals shaped from the same rough crystal was broken into pieces at 99.4 GPa. The fracture stress is very low value rather than the calculated one based on (111) [110] slip system mechanism. In the broken crystal, the center line of plurality of the pyramidal shape of stacking faults differed in the location from the culet area. The breaking of diamond crystal was dependent on the distribution of plane defects in the crystal.
Subject
diamond
X-ray topography
anvil crystal
high pressure
lattice defect
Journal Title
Transactions of the Materials Research Society of Japan
Volume
44
Issue
4
Start Page
143
End Page
148
ISSN
1382-3469
ISSN(Online)
2188-1650
Published Date
2019/08/01
DOI
Publisher
一般社団法人 日本MRS
Publisher Transcription
イッパン シャダン ホウジン ニホン MRS
NII Type
Journal Article
Format
PDF
Text Version
出版社版
OAI-PMH Set
Faculty of Science and Engineering